14-17 September 2021
America/Los_Angeles timezone

Modeling the Effect of Impurities on the Electron Lifetime in Liquid Xenon for nEXO

17 Sep 2021, 10:30
Detector techniques (HV, purification, cryogenics, calibration etc.) Detector Techniques (4B)


Ako Jamil (Yale University)


nEXO is a 5 tonne liquid xenon (LXe) time projection chamber (TPC) planned to search for the neutrinoless double beta decay of $^{136}$Xe with a target half-life sensitivity of about $10^{28}$ years. Electrons from an event within the TPC will be drifted up to $1.3\,\mathrm{m}$ and to ensure minimal charge loss nEXO aims to reach an electron lifetime of $10\,\mathrm{ms}$. This lifetime is inversely proportional to the concentration of electro-negative impurities, for which multiple species with different attachment cross-sections may be important. Various sources for impurities such as diffusion out of commonly used plastics, desorption from metal surfaces and leaks to atmosphere were investigated. This talk will go over measurements of outgassing from plastics and relevant parameters to extrapolate to the effect impurities have on the electron lifetime in large liquid xenon detectors.

Primary author

Ako Jamil (Yale University)

Presentation Materials